光电子技术, 2016, 36 (4): 253, 网络出版: 2016-12-21
内嵌式触摸显示屏中横条纹缺陷的研究与改善
Investigation and Improvement of H-line Defect on In-cell Touch Panel Screen
横条纹缺陷 内嵌式触控 水平同步扫描模式 报点率 显示质量 H-line defect in-cell touch long H sync mode report rate display quality
摘要
针对内嵌式触控显示屏中横条纹缺陷进行了原因分析, 提出了相应的解决方案, 如调节扫描电压、改变驱动模式、增强驱动能力等。实验结果表明, 水平同步扫描模式下, 内嵌式触控屏报点率达到120 Hz, 横条纹缺陷问题得到了改善, 对提高显示质量有重要意义。
Abstract
The possible reasons for H-line defect of in-cell touch panel are analyzed and the corresponding solutions are proposed, such as tuning scanning voltage, defining panel driving mode, and improving IC driving capability, etc.. The experiment results show that the report rate of in-cell touch panel reaches 120 Hz under long H sync mode and H-line problem is well solved, which has great significance for the improvement of display quality.
周亚玲, 张洲, 蔡育徵, 徐盼, 马长文. 内嵌式触摸显示屏中横条纹缺陷的研究与改善[J]. 光电子技术, 2016, 36(4): 253. ZHOU Yaling, ZHANG Zhou, CAI Yuzheng, XU Pan, MA Changwen. Investigation and Improvement of H-line Defect on In-cell Touch Panel Screen[J]. Optoelectronic Technology, 2016, 36(4): 253.
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