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Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

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Abstract

In this Letter, a refractive index measurement of a dielectric sample using highly focused radially polarized light is reported. Through imaging analysis of the optical field at the pupil plane of a high numerical aperture (NA) objective lens reflected by the sample under study, the Brewster angle is found. Employing a high NA objective lens allows the measurement of multiple angles of incidence from 0° to 64° in a single shot. The refractive index of the sample is estimated using the measured Brewster angle. The experimental results are compared with the theoretical images computed with the Fresnel theory, and a good agreement is obtained.

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DOI:10.3788/col201715.030004

所属栏目:General

收稿日期:2016-10-27

录用日期:2016-12-28

网络出版日期:2017-02-06

作者单位    点击查看

Guadalupe López-Morales:GIPYS Laboratory, Centro de Investigaciones en óptica, A. C., León, Gto 371 50, México
Victor-Manuel Rico-Botero:GIPYS Laboratory, Centro de Investigaciones en óptica, A. C., León, Gto 371 50, México
Rafael Espinosa-Luna:GIPYS Laboratory, Centro de Investigaciones en óptica, A. C., León, Gto 371 50, México
and Qiwen Zhan:Department of Electro-Optics and Photonics, University of Dayton, Dayton, OH 45469, USA

联系人作者:联系作者(lopezmg@cio.mx)

备注:GLM and VMRB acknowledge CONACYT-México for the scholarship 353317 and 394565, respectively, which were given to them to do their graduate studies.

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引用该论文

Guadalupe López-Morales, Victor-Manuel Rico-Botero, Rafael Espinosa-Luna, and Qiwen Zhan, "Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)," Chinese Optics Letters 15(3), 030004 (2017)

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