Optic flaws detection and location based on a plenoptic camera
In this Letter, we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics. Specifically, due to the extended depth of field of the plenoptic camera, a series of optics can be inspected efficiently and simultaneously. Moreover, the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them. Besides, the detection and location can be implemented with a single snapshot of the plenoptic camera. Consequently, this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics, which may lead to performance degradation of optical systems.
Bing Xu：Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu 61 0209, ChinaInstitute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 6102 09, China
Ping Yang：Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu 61 0209, ChinaInstitute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 6102 09, China
and Guomao Tang：Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu 61 0209, ChinaInstitute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 6102 09, China
备注：We thank Weigao Xu at Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences for the discussions on calibration methods of the plenoptic camera. This work was supported by the Key Scientific Equipment Develop Project of China (No. ZDYZ2013-2) and the National “863” Program of China (Nos. G158603 and G158201).
【1】C. E. Thompson, C. F. Knopp, and D. E. Decker, Proc. SPIE 3492, 921 (1998).
【2】A. F. Rainer, R. K. Dickson, R. T. Jennings, J. F. Kimmons, S. M. Maricle, R. P. Mouser, S. Schwartz, and C. L. Weinzapfel, Office of Scientific & Technical Information Technical Reports 3492, 556 (1999).
【3】A. F. Rainer, in Laser-Induced Damage in Optical Materials: 1997 (1997), p.?272.
【4】A. Conder, S. Azevedo, L. Kegelmeyer, and M. Spaeth, Proc. SPIE 7797, 125 (2010).
【5】S. Zhang, J. Bai, K. Wang, F. He, and B. Zhou, in Applied Optics and Photonics China (2015).
【6】Z. M. Liao, B. Raymond, J. Gaylord, R. Fallejo, J. Bude, and P. Wegner, Opt. Express 22, 28845 (2014).
【7】E. H. Adelson, and J. Y. A. Wang, IEEE Trans. Pattern Anal. Mach. Intell. 14, 99 (1992).
【8】C. Perwass, and L. Wietzke, Proc. SPIE 8291, 829108 (2012).
【9】D. G. Dansereau, O. Pizarro, and S. B. Williams, in IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (2013), p.?1027.
【13】R. I. Hartley, and P. Sturm, Comput. Vision Image Understanding 68, 146 (1997).
【14】V. Drazic, J.-J. Sacré, A. Schubert, J. Bertrand, and E. Blondé, J. Electron. Imaging 21, 011007 (2012).
【15】A. Oberd?rster, and H. P. Lensch, in IS&T/SPIE Electronic Imaging (2013), paper?86671R.
【16】T. Georgiev, and A. Lumsdaine, in Proceedings of Eurographics (2009), p.?5.
【17】Y. Luan, X. He, B. Xu, P. Yang, and G. Tang, Opt. Eng. 55, 043111 (2016).
【18】D. G. Lowe, Int. J. Comput. Vision 60, 91 (2004).
【19】R. Hartley, and A. Zisserman, Multiple View Geometry in Computer Vision (Cambridge University, 2003).
Yinsen Luan, Bing Xu, Ping Yang, and Guomao Tang, "Optic flaws detection and location based on a plenoptic camera," Chinese Optics Letters 15(4), 041102 (2017)