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基于叠层衍射成像术的量化相位显微成像

Quantitative Phase Microscopy Imaging Based on Ptychography

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摘要

作为一种新兴的无透镜相位恢复技术,叠层衍射成像大大提高了传统相位迭代恢复算法的收敛速度和抗噪能力,具有大视场、高对比度、高分辨率、无需标记、长工作距离、不丢失相位低频分量等优点,在多个领域得到了广泛的应用。介绍了量化相位显微成像领域的研究现状与最新进展,特别是传统叠层衍射成像术(CP)和傅里叶叠层衍射成像术(FP)的基本原理、技术进展及相关应用,着重介绍了快速FP及基于FP的荧光显微成像技术,总结了CP和FP目前面临的问题及未来的发展趋势。

Abstract

As one novel lensless phase retrieval technique, ptychography greatly improves the convergence speed and the anti-noise capability of traditional phase iterative retrieval algorithms. Ptychography features a lot of merits, such as large field of view, high contrast, high resolution, and label-free as well as long working distance without losing low frequency phase component, which has been widely applied in various regions. The research status and the latest advances in the field of quantitative phase microscopy imaging are introduced, especially the fundamentals, technique advances and related applications of conventional ptychography (CP) and Fourier ptychography (FP). The fast FP and the fluorescence microscopy imaging based on FP are mainly discussed and the current problems and future trends of CP and FP are also summarized.

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中图分类号:O436

DOI:10.3788/lop54.040001

所属栏目:综述

基金项目:国家自然科学基金(61377008,81427802)

收稿日期:2016-11-02

修改稿日期:2016-12-05

网络出版日期:--

作者单位    点击查看

潘安:中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室, 陕西 西安 710119中国科学院大学, 北京 100049
张艳:中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室, 陕西 西安 710119中国科学院大学, 北京 100049
赵天宇:中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室, 陕西 西安 710119中国科学院大学, 北京 100049
汪召军:中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室, 陕西 西安 710119中国科学院大学, 北京 100049
但旦:中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室, 陕西 西安 710119中国科学院大学, 北京 100049
史祎诗:中国科学院大学, 北京 100049中国科学院光电研究院, 北京 100094
姚保利:中国科学院西安光学精密机械研究所瞬态光学与光子技术国家重点实验室, 陕西 西安 710119

联系人作者:潘安(panan@opt.cn)

备注:潘安(1993-),男,博士研究生,主要从事光学显微成像方面的研究。

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引用该论文

Pan An,Zhang Yan,Zhao Tianyu,Wang Zhaojun,Dan Dan,Shi Yishi,Yao Baoli. Quantitative Phase Microscopy Imaging Based on Ptychography[J]. Laser & Optoelectronics Progress, 2017, 54(4): 040001

潘安,张艳,赵天宇,汪召军,但旦,史祎诗,姚保利. 基于叠层衍射成像术的量化相位显微成像[J]. 激光与光电子学进展, 2017, 54(4): 040001

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