在轻气炮加载实验平台上, 利用小型闪光X射线源建立了一套脉冲X射线衍射测量系统。利用该测量系统对平面冲击加载条件下LiF晶体微观结构变化进行了研究, 得到了不同冲击加载压力下LiF晶体的单次脉冲X射线衍射图像。实验结果表明: 沿［100］晶向加载, LiF晶体晶格发生了压缩, 压缩量与衍射峰偏移量相关; 基于小型闪光X射线源的脉冲X射线衍射测量系统可实现冲击压缩下材料微观结构变化的定量化测量, 同时具有体积小、操作简单等优点, 为研究弹塑性形变微观机理提供了一种有效手段。

A pulse X-ray diffraction measurement system is established by using a miniaturized flash X-ray source on gas gun loading experimental platform. The system is used to study the microstructure change of LiF crystal lattice under plate shock loading experiments. Single pulse X-ray diffraction images from LiF crystals are obtained under different shock loading pressures. Experimental results show that crystal lattice of LiF is compressed when LiF crystal is loaded along ［100］ orientation, and the amount of compression is related to the shift of diffraction peak position. Quantitative measurement of material microstructure change under shock compression can be achieved by pulse X-ray diffraction measurement system using miniaturized flash X-ray source. The system described here has advantages such as small size and easy to use, and it provides effective method to study the microscopic mechanism of elastic-plastic deformation.