中国激光, 2017, 44 (10): 1010003, 网络出版: 2017-10-18  

含多孔硅层的波导耦合光栅纳米异质结构的折射率传感机理 下载: 779次

Refractive Index Sensing Mechanism of Waveguide Coupled Gratings Nano-Heterostructure Containing Porous Silicon Layers
作者单位
1 燕山大学电气工程学院河北省测试计量技术及仪器重点实验室, 河北 秦皇岛 066004
2 燕山大学信息科学与工程学院河北省特种光纤与光纤传感器重点实验室, 河北 秦皇岛 066004
3 河北先河环保科技股份有限公司, 河北 石家庄 050035
摘要
基于波导耦合光栅的共振原理和多孔硅的光学传感特性, 提出一种含多孔硅层的波导耦合光栅纳米异质结构的折射率传感模型。根据古斯-汉欣(Goos-Hnchen)位移理论和波导耦合光栅共振的相位匹配条件, 建立共振波长与待测样本折射率之间的关系模型, 并分析了折射率传感结构的折射率传感特性。利用多孔硅高效的承载机制, 将其作为待测样本承载单元, 选用不同浓度的乙二醇溶液作为待测样本, 对该折射率传感结构的灵敏度和品质因数Q进行分析。结果表明, 该折射率传感结构对乙二醇溶液的灵敏度为2.2 nm/1%, Q值为226, 证明了该传感结构的有效性, 它可实现对低浓度待测样本的检测。
Abstract
Based on the resonance principle of waveguide coupled gratings and optical sensing properties of porous silicon, a refractive index sensing model of waveguide coupled gratings nano-heterostructure is proposed. According to the theory of Goos-Hnchen displacement and phase matching conditions of waveguide coupled gratings resonance, the relationship model between the resonant wavelength and the refractive index of the detected sample is established, and the refractive index sensing properties of the refractive index sensing structure are analyzed. Taking the porous silicon as bearing units of detected samples according to its effective bearing mechanism, we analyze the sensitivity and the quality factor Q of the refractive index sensing structure by detecting solutions of ethylene glycol with different concentrations. The results show that the sensitivity of the refractive index sensing structure to the solution of ethylene glycol is 2.2 nm/1%, and the Q value is 226, which proves the validity of this sensing structure. The sensing structure can detect the samples with low concentration.

陈颖, 赵志勇, 田亚宁, 刘晓飞, 朱奇光, 翟应俭, 李少华. 含多孔硅层的波导耦合光栅纳米异质结构的折射率传感机理[J]. 中国激光, 2017, 44(10): 1010003. Chen Ying, Zhao Zhiyong, Tian Yaning, Liu Xiaofei, Zhu Qiguang, Zhai Yingjian, Li Shaohua. Refractive Index Sensing Mechanism of Waveguide Coupled Gratings Nano-Heterostructure Containing Porous Silicon Layers[J]. Chinese Journal of Lasers, 2017, 44(10): 1010003.

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