红外技术, 2017, 39 (8): 682, 网络出版: 2017-10-30   

非制冷红外探测器片上偏压逐点非均匀性校正方法

On-chip Bias Point-by-Point Non-uniformity Correction of Uncooled Infrared Detector
作者单位
1 中国科学院红外探测与成像技术重点实验室,中国科学院上海技术物理研究所,上海 200083
2 中国科学院大学,北京 100049
3 中国科学院上海技术物理研究所启东光电遥感中心,江苏 启东 226200
摘要
针对非制冷红外焦平面阵列(Uncooled Infrared Focal Plane Array,UIRFPA)成像系统中普遍存在的非均匀性较差的问题,本文提出了一种基于探测器工作偏压对其输出影响来进行片上非均匀性校正(Non-uniformity Correction, NUC)的方法——探测器片上偏压逐点NUC 技术。该方法是在探测器每一个像元关键偏压VEB 和VFID 上使用DAC 供电,通过在积分前对每个像元的偏压进行单独的调整来校正其信号输出值。在不影响探测器帧频的情况下,实现了非均匀性从1.9%降低到0.4%,有效改善了探测器原始信号的非均匀性,且具有很好的实时性。
Abstract
Aiming at solving the problem of poor uniformity in uncooled infrared focal plane array imaging systems, a method for on-chip nonuniformity correction (NUC), which is a correction based on the effect of detector bias on its output, is proposed, i.e., a detector on-chip point-by-point NUC method. In this method, the key biases VEB and VFID of each pixel at the detector are powered by digital-to-analog convertors. The output signal is corrected by adjusting the bias of each pixel individually, before integration. As a result, the nonuniformity is reduced from 1.9% to 0.4% without affecting the frame rate. This method effectively improves the nonuniformity of the original signal of the detector and has good real-time performance.

张宁, 柴孟阳, 赵航斌, 孙德新. 非制冷红外探测器片上偏压逐点非均匀性校正方法[J]. 红外技术, 2017, 39(8): 682. ZHANG Ning, CHAI Mengyang, ZHAO Hangbin, SUN Dexin. On-chip Bias Point-by-Point Non-uniformity Correction of Uncooled Infrared Detector[J]. Infrared Technology, 2017, 39(8): 682.

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