在真空和不同温度条件下,通过电子枪辐照的方式对聚酰亚胺材料进行表面充电,测量其表面电位随时间的衰减特性。 得到了聚酰亚胺材料电导率随温度的变化规律,并结合等温表面电位衰减理论计算了其在不同温度下的陷阱分布规律。随着温度的升高,聚酰亚胺的浅陷阱数量逐渐增多, 深陷阱数量逐渐减少。浅陷阱的变化规律与聚酰亚胺电导率成正比,即浅陷阱越多,载流子的迁移作用越强。研究结果可为聚酰亚胺材料抗老化和防沿面闪络的 改性设计提供有利参考。

Under the conditions of vacuum and different temperatures, surface charging of polyimide materials is carried out by electron gun irradiation, and their surface potential decay characteristics with time are measured. Variation of conductivity with temperature is obtained, and the trap distribution of polyimide at different temperatures is calculated combining with theory of isothermal surface potential decay. With the increasing of temperature, the number of shallow traps in polyimide increases gradually, and that of deep traps reduces gradually. The variation rule of shallow traps is proportional to the conductivity of polyimide, that is to say, the more the shallow traps are, the stronger the migration of carriers will be. Research results can provide a useful reference for the modification of anti-aging and anti-flashover of polyimide materials.