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基于散射光谱颗粒折射率测量系统的散射角和放大率的精确确定

Accurate Determination of Scattering Angle and Magnification Based on Scattering Spectral Particle Refractive Index Measurement System

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摘要

基于颗粒光散射成像原理, 通过测量聚焦面上的零级谱与一级谱之间的距离, 即可得到该颗粒的折射率。分析了成像系统接收角和放大率偏差对颗粒折射率测量精度的影响, 给出了接收散射角和放大率的取值范围。提出了一种基于线性拟合精确确定散射角和放大率的实验方法, 并对直径为45 μm的标准聚苯乙烯(PSL)颗粒和19.1 μm的玻璃颗粒的折射率进行测量, 相对测量误差分别为-0.19%和1.53%, 验证了所提方法的有效性。

Abstract

On the basis of the particle scattering imaging, the refractive index of the particle can be obtained by the distance between the zero-order and the first-order spectra on the focal plane. The influences of the received angle and the magnification deviation of the imaging system on the measurement accuracy of the particle refractive index are analyzed. And the ranges of the received scattering angles and the magnification are given. An experimental method based on linear fitting is proposed to accurately determine the scattering angle and the magnification. The refractive indices of standard polystyrene (PSL) particle with diameter of 45 μm and glass particle with diameter of 19.1 μm are measured with the proposed method, their relative measurement errors are -0.19% and 1.53%, respectively. The experimental results verify the effectiveness of the proposed method.

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中图分类号:TN247;TN249

DOI:10.3788/cjl201845.1004003

所属栏目:测量与计量

基金项目:国家自然科学基金(61275012, 61275019)

收稿日期:2018-04-15

修改稿日期:2018-05-11

网络出版日期:2018-05-17

作者单位    点击查看

孟睿:天津大学精密仪器与光电子工程学院, 天津 300072光电信息技术教育部重点实验室, 天津 300072
葛宝臻:天津大学精密仪器与光电子工程学院, 天津 300072光电信息技术教育部重点实验室, 天津 300072
吕且妮:天津大学精密仪器与光电子工程学院, 天津 300072光电信息技术教育部重点实验室, 天津 300072
徐捷:天津大学精密仪器与光电子工程学院, 天津 300072光电信息技术教育部重点实验室, 天津 300072

联系人作者:葛宝臻(gebz@tju.edu.cn); 孟睿(mengrui@tju.edu.cn);

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引用该论文

Meng Rui,Ge Baozhen,Lü Qieni,Xu Jie. Accurate Determination of Scattering Angle and Magnification Based on Scattering Spectral Particle Refractive Index Measurement System[J]. Chinese Journal of Lasers, 2018, 45(10): 1004003

孟睿,葛宝臻,吕且妮,徐捷. 基于散射光谱颗粒折射率测量系统的散射角和放大率的精确确定[J]. 中国激光, 2018, 45(10): 1004003

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