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Optical rectification in surface layers of germanium

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Abstract

In this Letter, we have demonstrated significant electric field induced (EFI) optical rectification (OR) effects existing in the surface layers of germanium (Ge) and measured the distributions of EFI OR signals along the normal directions of surface layers of Ge samples. Based on the experimental results, the ratios of the two effective second-order susceptibility components χzzz(2eff)/χzxx(2eff) for Ge(001), Ge(110), and Ge(111) surface layers can be estimated to be about 0.92, 0.91, and 1.07, respectively. The results indicate that the EFI OR can be used for analyzing the properties on surface layers of Ge, which has potential applications in Ge photonics and optoelectronics.

Newport宣传-MKS新实验室计划
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DOI:10.3788/col201816.102401

所属栏目:Optics at surfaces

基金项目:This work was partially supported by the National Natural Science Foundation of China (Nos. 61474055 and 60976043) and the National 863 Program of China (No. 2009AA03Z419).

收稿日期:2018-07-05

录用日期:2018-08-17

网络出版日期:2018-09-19

作者单位    点击查看

Li Zhang:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Fangye Li:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Shuai Wang:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Qi Wang:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Kairan Luan:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Xi Chen:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Xiuhuan Liu:College of Communication Engineering, Jilin University, Changchun 130012, China
Lingying Qiu:State Key Laboratory of Supramolecular Structure and Materials, Institute of Theoretical Chemistry, Jilin University, Changchun 130012, China
Zhanguo Chen:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Jihong Zhao:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Lixin Hou:College of Information Technology, Jilin Agricultural University, Changchun 130118, China
Yanjun Gao:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
Gang Jia:State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China

联系人作者:Zhanguo Chen(czg@jlu.edu.cn)

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引用该论文

Li Zhang, Fangye Li, Shuai Wang, Qi Wang, Kairan Luan, Xi Chen, Xiuhuan Liu, Lingying Qiu, Zhanguo Chen, Jihong Zhao, Lixin Hou, Yanjun Gao, Gang Jia, "Optical rectification in surface layers of germanium," Chinese Optics Letters 16(10), 102401 (2018)

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