光谱学与光谱分析, 2018, 38 (12): 3929, 网络出版: 2018-12-16  

基于X射线光子计数探测技术的材料K-edge特性识别实验研究

Experimental Study of Material K-Edge Characteristics Identification Based on X-ray Photon-Counting Detection Technique
作者单位
1 重庆大学光电技术及系统教育部重点实验室, 重庆 400044
2 重庆大学工业CT无损检测教育部工程研究中心, 重庆 400044
3 重庆大学生物流变科学与技术教育部重点实验室, 重庆 400044
4 天津大学精密仪器与光电子工程学院, 天津 300072
摘要
X射线光子计数探测器是多能谱CT成像技术的核心, 其通过能量阈值可以选择记录不同能量的X射线光子, 有助于分析不同材质的物理特性。 利用搭建的基于光子计数探测器的多能谱CT系统, 开展高纯度金属材料K-edge特性识别实验研究。 通过设置探测器的不同能量阈值, 在不同能量范围获取金属材料投影图像, 利用投影图像灰度信息分析不同能量X射线的衰减特性, 以识别金属材料K-edge特性。 最终实验结果表明, 基于光子计数探测器的X射线能谱CT系统, 能够识别金属材料与特定能量X射线光子发生相互作用所表现出的K-edge特性。 通过计算K-edge特征峰能量阈值与材料K-edge理论能量值之间的线性对应关系, 对光子计数探测器的能量阈值进行了标定。
Abstract
X-ray photon-counting detector is the core of the spectral CT imaging technique, and it could choose to record different energy X-ray photons by detector energy threshold, which is helpful to analyze the physical properties of different materials. In this paper, we used a spectral CT system based on photon-counting detector to study the K-edge characteristics of high purity metallic materials. By setting different energy thresholds for the detector, we could obtain the projection images of the metallic materials in different energy ranges. The attenuation characteristics of different energy X-ray could be analyzed by the gray information of projection images to identify the K-edge characteristics of metallic materials. The final experimental results demonstrated that the X-ray spectral CT system based on photon-counting detector can recognize the K-edge characteristics of metallic materials interacting with specific energy X-ray photons. The energy threshold for photon-counting detector can be calibrated by calculating the linear correspondence between K-edge peak energy threshold and K-edge theoretical energy value.

何鹏, 吴晓川, 安康, 邓刚, 王星, 周仲兴, 魏彪, 冯鹏. 基于X射线光子计数探测技术的材料K-edge特性识别实验研究[J]. 光谱学与光谱分析, 2018, 38(12): 3929. HE Peng, WU Xiao-chuan, AN Kang, DENG Gang, WANG Xing, ZHOU Zhong-xing, WEI Biao, FENG Peng. Experimental Study of Material K-Edge Characteristics Identification Based on X-ray Photon-Counting Detection Technique[J]. Spectroscopy and Spectral Analysis, 2018, 38(12): 3929.

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