光阴极光灵敏度的测量误差大小对微光像增强器寿命预测结果影响很大，高精确度的光灵敏度测量可以实现微光像增强器寿命的准确预测。本文通过分析光阴极光灵敏度测量原理、方法和装置特性，利用光灵敏度误差分配方法，在保证满足寿命预测所需光灵敏度测量误差的前提下，确定了一种合成测量误差为 3.8%的光灵敏度测量方案，基于该方案预测的微光像增强器寿命与实际寿命试验验证结果的相对偏差不超过 2%，为提高微光像增强器的工程研制效率提供了有效的检测手段。

The measurement error of the photocathode integral sensitivity has a considerable influence on the life prediction result of the low-light-level image intensifier. Highly accurate integral sensitivity measurements enable accurate prediction of the life of the low light level image intensifier. In this paper the principle, method and device characteristics of photocathode sensitivity measurement, using integral sensitivity error distribution method, under the premise of ensuring the integral sensitivity measurement error required for life prediction was analyzed. An integral sensitivity measurement scheme with a synthetic measurement error of 3.8% was determined. The relative deviation between the life of the low-light-level image intensifier and the actual life test verification result predicted by the scheme is less than 2%. The given method provides an effective means of detecting the engineering development efficiency of the low-light-level image intensifier.