为了解决传统绝缘子红外检测方法存在检测盲区的问题，在绝缘子盘面温升规律仿真分析和实验研究的基础上，将盘面特征纳入劣化绝缘子诊断判据中，提出了一种基于铁帽和盘面温升特征的劣化绝缘子红外检测方法，现场实测验证情况表明该方法可以提高绝缘子检测的准确率。绝缘子盘面温升规律实验研究表明：劣化绝缘子盘面温度较相邻正常绝缘子低，呈“负温升”特征；“负温升”特征的明显程度与劣化绝缘子在串中位置、环境湿度和表面污秽状况有关：两端位置时劣化绝缘子盘面“负温升”特征更明显，湿度大时劣化绝缘子盘面“负温升”特征更明显。

To improve the accuracy of insulator detection technology based on infrared thermal imaging, a diagnosis method based on temperature rise characteristics of insulator steel caps and disks is proposed. According to the voltage distribution of insulator strings and heating model of insulators, the temperature rise law of insulator steel caps and disks is studied. Simulation and experimental results show that the insulator disk temperature of a faulty insulator is lower than that of adjacent normal insulator, which shows negative temperature rise characteristics. The evident degree of negative temperature rise characteristics of faulty insulators is related to environment humidity, insulator surface contamination, and the position of the faulty insulator on the insulator string. The higher the ambient humidity, the more evident is the negative temperature rise characteristic of the faulty insulator disk. When the faulty insulator is at the end of the insulator string, the negative temperature rise characteristics of the faulty insulator disk are more evident.