红外技术, 2019, 41 (3): 245, 网络出版: 2019-04-05   

热像仪聚焦程度对红外辐射检测的影响研究

The Influence of Degree of Thermal Imager Focusing on the Detection Accuracy of Infrared Radiation
作者单位
1 中北大学软件学院, 山西 太原 030051
2 中北大学电子测试技术国家重点实验室, 山西 太原 030051
摘要
热像仪主要依据红外辐射定律对物体由于温度产生的红外辐射进行测量, 是非接触式测温方式的一种方法。在保持其它影响测温精度因素不变的条件下, 通过保持热像仪稳定输出来提高精准度。实验采用黑体作为目标辐射源, 并将温度设定后保持不变。保持热像仪与辐射源的位置固定不变, 只调节聚焦程度来采集数据。分析热像仪聚焦程度对其输出值的影响, 通过分析可以看出对于均匀的辐射目标源, 当热像仪离焦时各个随机点输出的值不一致。只有当其在聚焦的状态下, 随机点及区域输出的值才趋于稳定。并计算各点的在不同聚焦程度下的变异系数及区域内方差, 进一步确定热像仪输出值的稳定性。实验表明: 热像仪聚焦程度对其输出值有较大影响, 利用文中聚焦程度与变异系数、区域内方差的计算对于判别热像仪输出值的稳定性具有一定的作用。
Abstract
Based on radiation laws, infrared radiation caused by temperature can be measured by thermal imagers, as one of non-contact temperature measuring method. Keeping other factors unchanged, we manage to improve the precision of thermal imagers. We used blackbody as the target radiation source, and the temperature is set to remain unchanged. Keeping a fixed distance between the thermal imager and the radiation source, we adjust the degree of focus to collect data. Influence of the degree of focus of the thermal imager on its output values is analyzed. It can be found that the values of the random points are not consistent with uniform radiation target sources, when the thermal imager is out of focus. Only when it is in a focused state, the random points and the regional output values tend to be stable. Variation coefficients and variances of every points in the region in different focusing degrees were calculated, the stability of the output values of the thermal imager were determined. The experimental results show that the degree of focus of the thermal imager has a great influence on its output values. Variation coefficients and variances in the region can be used to determine the stability of the output values of thermal imagers.

李众, 郝争辉, 王高, 张猛. 热像仪聚焦程度对红外辐射检测的影响研究[J]. 红外技术, 2019, 41(3): 245. LI Zhong, HAO Zhenghui, WANG Gao, ZHANG Meng. The Influence of Degree of Thermal Imager Focusing on the Detection Accuracy of Infrared Radiation[J]. Infrared Technology, 2019, 41(3): 245.

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