光电子技术, 2019, 39 (1): 63, 网络出版: 2019-04-11
基于JAS膜技术下TFT-LCD像素电压串扰的影响因素研究
Influence Factors Study on TFT-LCD Pixel Voltage Crosstalk Based on JAS Film Technology
有机绝缘膜技术 薄膜晶体管液晶显示器像素结构 寄生电容 像素电压串扰 JAS film TFT-LCD pixel structure parasitic capacitance pixel voltage crosstalk
摘要
基于JAS膜技术的像素结构, 通过分析实验, 研究对比了JAS和non-JAS两个机种下, 不同的面板反转方式分别对这两个机种像素电压的串扰影响。结果发现, non-JAS机种的像素电压在不同反转方式下受到串扰的影响最小, JAS机种由于数据线与TFT漏极之间的寄生电容(Csd)的影响而产生颜色串扰的问题, 并提出了问题的解决方法。本文的研究结果对大尺寸、高分辨率TFT-LCD产品的像素电压串扰问题及像素结构设计上有一定的指导作用和参考意义。
Abstract
Based on the technology of the JAS film TFT-LCD pixel structure, the pixel voltage crosstalk effects of different panel inversion modes on the two kinds of JAS and non-JAS module were compared by analyzing the experiments. The results show that crosstalk has nearly no effect on the pixel voltage of the non-JAS under different inversion modes. The solution of the color crosstalk problem caused by the parasitic capacitance (Csd) between the data line and the TFT drain electrode was proposed. These results have some guiding effect to solve the pixel voltage crosstalk problem and the pixel structure design of the large size and high resolution TFT-LCD products.
姚家俊, 盛何君, 宋见龙. 基于JAS膜技术下TFT-LCD像素电压串扰的影响因素研究[J]. 光电子技术, 2019, 39(1): 63. YAO Jiajun, SHENG Hejun, SONG Jianlong. Influence Factors Study on TFT-LCD Pixel Voltage Crosstalk Based on JAS Film Technology[J]. Optoelectronic Technology, 2019, 39(1): 63.