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摘要

A Schwarzschild microscope with a numerical aperture of 0.2 and a magnification of 130 in a 100 μm field of view (FOV) is designed and is working at 13.5 nm. Meanwhile, a CCD is used as a detector with a pixel size of 13 μm×13 μm and imaging area of 13 mm×13 mm. The imaging quality with tolerances of system and errors of mirrors are considered. We obtain that the best on-axe

PDF全文 Chinese Optics Letters | 2017,15(04):043401
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摘要

We present a simple method to measure the spatial coherence of hard x-ray beams. Based on the convolution of Gaussian functions, we analyze the diffraction patterns of a grating irradiated by partially coherent hard x rays with a constrained beam diameter. The spatial coherence properties of an x-ray beam are obtained from the width of the diffraction peaks with high accuracy.

PDF全文 Chinese Optics Letters | 2017,15(03):033401
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摘要

Nested multilayer mirrors are commonly used in X ray telescope structure to increase the collecting area. To balance the difficulty and cost of producing these mirrors, Wolter-I structures are replaced with conical Wolter-I structures, but these can lead to significantly poorer angular resolutions. In this Letter, we consider changing one of the mirror shapes (paraboloid or hyp

PDF全文 Chinese Optics Letters | 2016,14(12):123401
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摘要

Full-field x ray nano-imaging (FXNI) is one of the most powerful tools for in-situ, non-destructive observation of the inner structure of samples at the nanoscale. Owing to the high flux density of the third-generation synchrotron radiation facility, great progress is achieved for FXNI and its applications. Up to now, a spatial resolution of 20 nm for FXNI is achieved. Based on

PDF全文 Chinese Optics Letters | 2016,14(09):093401
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摘要

Complementary analysis techniques are applied in this work to study the interface structure of Mo/Si multilayers. The samples are characterized by grazing incident x-ray reflectivity, x-ray photoelectron spectroscopy, high-resolution transmission electron microscopy, and extreme ultraviolet reflectivity. The results indicate that the layer thickness is controlled well with smal

PDF全文 Chinese Optics Letters | 2016,14(08):083401
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摘要

The vacuum-sealed miniature modulated x-ray source (VMMXS) with a hot cathode is fabricated via the single-step brazing process in a vacuum furnace. An experiment following the VMMXS is implemented to present its performances, including the influence of grid electrode potential on x-ray intensities. The modulation type of the grid electrode as a switch is proposed, and its feas

PDF全文 Chinese Optics Letters | 2016,14(07):073401
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摘要

A tomography device based on a conventional laboratory x ray source, polycapillary parallel x ray lens (PPXRL), and polycapillary collimating x ray lens (PCXRL) is designed. The PPXRL can collect the divergent x ray beam from the source and focus it into a quasi-parallel x ray beam with a divergence of 4.7 mrad. In the center of quasi-parallel x ray beam, there is a plateau reg

PDF全文 Chinese Optics Letters | 2015,13(09):093401
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摘要

We report a design for one nanometer X-ray focusing by a complex refractive lens, which is capable of focusing 20 keV X-rays down to a lateral size of 0.92 nm (full-width at half-maximum (FWHM)) and an axial size of 98 nm (FWHM) with intensity gain of 49050. This complex refractive lens is comprised of a series of kinoform lenses, whose aperture is gradually matched to the conv

PDF全文 Chinese Optics Letters | 2014,12(12):123401
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摘要

A four-channel Kirkpatrick–Baez microscope working at multiple energy bands is developed for multiframe X-ray imaging diagnostics at the Shenguang-II laser facility. The response to the multiple energy bands is realized by coating the double-periodic multilayers on the reflected surfaces of the microscope. Because of the limited size of the microstrips in the X-ray framing cam

PDF全文 Chinese Optics Letters | 2014,12(09):093401
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摘要

A time-resolved multispectral X-ray imaging approach with new version of multi-channel Kirkpatrick-Baez (KB) microscope is developed for laser plasma diagnostics at the kilojoule-class Shenguang-II laser facility (SG-II). The microscope uses a total external reflection mirror in the sagittal direction and an array of multilayer mirrors in the tangential direction to obtain mult

PDF全文 Chinese Optics Letters | 2014,12(08):083401
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