Associate Editors
Eric Cassan, Centre for Nanoscience and Nanotechnologies, Université Paris-Sud, France
Nunzio Cennamo, University of Campania Luigi Vanvitelli, Italy
Giuseppe D'Aguanno, The Johns Hopkins University-Applied Physics Lab, USA
Chun-Hua Dong, University of Science and Technology of China, China
Yan Feng, Shanghai Institute of Optics and Fine Mechanics, CAS, China
Weibo Gao, Nanyang Technological University, Singapore
Frederic Gardes, University of Southampton, UK
Li Ge, City University of New York, USA
Yong-Zhen Huang, Institute of Semiconductors, CAS, China
Xianmin Jin, Shanghai Jiao Tong University, China
Yuri Kivshar, Australian National University, Australia
Hao-Chung (Henry) Kuo, National Chiao Tung University, Taiwan
Xiaohang Li, King Abdullah University of Science & Technology, Saudi Arabia
Di Liang, Hewlett Packard Labs, USA
Jinyang Liang, Institut National de la Recherche Scientifique (INRS), Universite du Quebec, Canada
Huiyun Liu, University College London, UK
Zhiwen Liu, Pennsylvania State University, USA
Ryuji Morita, Hokkaido University, Japan
Cheng-Wei Qiu, National University of Singapore, Singapore
Stephan Reitzenstein, Technische Universität Berlin, Germany
Kebin Shi, Peking University, China
Zhipei Sun, Aalto University, Finland
Jingbi You, Institute of Semiconductors, CAS, China