Xu Ying,Wang Qingyuan,Luo Congcong,Hoon Sohn. Chip Crack Imaging Detection Based on Line Laser Phase-Locked Thermal Imaging[J]. Laser & Optoelectronics Progress, 2020, 57(6): 061018

许颖,王青原,罗聪聪,HoonSohn. 基于线激光锁相热成像的芯片裂纹成像检测[J]. 激光与光电子学进展, 2020, 57(6): 061018