提出一种在太赫兹波段检测物质琼斯矩阵的方法。利用太赫兹面阵成像系统对会聚太赫兹光场的纵向分量进行相干测量，由此提取太赫兹光场的偏振信息，并通过分别测量未放置样品、放置原始样品和样品旋转90°后的透射太赫兹光场偏振信息，提取样品的琼斯矩阵元素。利用此方法，分别对不同角度的太赫兹偏振片和波片进行了实验测量，并与理论结果进行比较，发现具有很好的一致性。研究结果说明，所提方法对表征物质在太赫兹波段的各向异性特征具有很好的实用性。

Herein, a method for extracting the Jones matrix of a material in the terahertz (THz) wave band is proposed. A THz focal-plane imaging system was utilized to coherently measure the longitudinal component of a converging THz field and to determine the THz polarization. Furthermore, the Jones matrix of the material was extracted by measuring the polarization of a reference THz field and the polarizations of the THz fields transmitted from a sample in its original position and with a 90° rotation. The proposed method was employed to measure the Jones matrices of a THz polarizer and a wave plate with different azimuthal angles, and the experimental results were consistent with theoretical calculations. This demonstrated the feasibility of the proposed method to characterize the anisotropy of materials in the THz frequency range.