Opto-Electronic Advances, 2022, 5 (4): 210015, Published Online: Jun. 30, 2022  

Field distribution of the Z2 topological edge state revealed by cathodoluminescence nanoscopy

Author Affiliations
1 School of Physics, State Key Lab for Mesoscopic Physics, Academy for Advanced Interdisciplinary Studies, Collaborative Innovation Center of Quantum Matter, and Nano-optoelectronics Frontier Center of Ministry of Education, Peking University Yangtze Delta Institute of Optoelectronics, Peking University, Beijing 100871, China
2 National Laboratory of Solid State Microstructures, Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, China
3 College of Chemistry and Molecular Engineering, Peking University, Beijing 100871, China
4 Department of Physics and HKU-UCAS Joint Institute for Theoretical and Computational Physics at Hong Kong, the University of Hong Kong, Pokfulam Road, Hong Kong, China
Photonic topological insulators with robust boundary states can enable great applications for optical communication and quantum emission, such as unidirectional waveguide and single-mode laser. However, because of the diffraction limit of light, the physical insight of topological resonance remains unexplored in detail, like the dark line that exists with the crystalline symmetry-protected topological edge state. Here, we experimentally observe the dark line of the Z2 photonic topological insulator in the visible range by photoluminescence and specify its location by cathodoluminescence characterization, and elucidate its mechanism with the p-d orbital electromagnetic field distribution which calculated by numerical simulation. Our investigation provides a deeper understanding of Z2 topological edge states and may have great significance to the design of future on-chip topological devices.

Xiao He, Donglin Liu, Hongfei Wang, Liheng Zheng, Bo Xu, Biye Xie, Meiling Jiang, Zhixin Liu, Jin Zhang, Minghui Lu, Zheyu Fang. Field distribution of the Z2 topological edge state revealed by cathodoluminescence nanoscopy[J]. Opto-Electronic Advances, 2022, 5(4): 210015.

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