研究了Xe/I2混合气体(气压70～1330 Pa)在直流辉光放电情况下XeI?匙挤肿拥男纬晒?程,得到了XeI?匙挤肿釉?240～270 nm波长范围内的荧光发射谱.并对XeI??(B→X)跃迁谱线强度随混合气体压力的变化进行了实验研究,发现气压为333 Pa时荧光最强;此条件下,放电等离子体的电子温度为13.2 eV,表明低气压放电等离子体中主要反应通道为快电子碰撞Xe使其跃迁至3P,随之与I2碰撞形成XeI(A,B,C).

Low pressure DC flowing discharge is used to study the formation of XeI  excimer in mixture of Xe/I 2. Fluorescence emission at spectral regions of 240～270 nm is examined. The characteristics of the emission spectra of the excimer and 253 nm intensity formed from mixture for different total gas pressures are reported. The investigation shows that 253 nm fluorescence intensity is the largest at 333 Pa and the correlated electron temperature of discharge plasma is 13.2 eV. The major reaction channel is Xe being excited to  3P by impact of high speed electron, and then XeI(A,B,C) being formed by collision between Xe( 3P) and I 2.