阐述了对玉石亚表面结构进行检测的频域光学相干层析(OCT)成像系统，以迈克耳孙干涉仪与光谱仪为主体，中心波长830 nm的超辐射发光二极管作为光源，纵向分辨率10 μm，横向分辨率15 μm，成像深度2 mm。实验结果验证了光学相干层析技术可以对玉石亚表面结构进行定量检测，利用数字图像分析技术可以计算出缺陷的精确位置以及尺寸大小，同时提出了玉石材质的评价方法，并且通过与扫描电子显微镜(SEM)检测的对比分析，进一步证明了光学相干层析可以成为检测玉石亚表面结构的新的技术途径。

A spectral domain optical coherence tomography(OCT) imaging system used to detect the subsurface morphologies of jades is described. It is mainly composed of Michelson interferometer and spectrograph with superluminescent diode light source of 830 nm central wavelength, the depth resolution is 10 μm , lateral resolution is 15 μm, penetration depth is 2 mm. The experimental results validate that the OCT technology can be applied in the quantificational detection of the jades′ morphologies, making use of digital image analysis technology, the precise location and size of disfigurements can be calculated, simultaneously the quantificational method to evaluate the jades′ quality is put forward. In addition, by means of comparing OCT with scanning electro microscope (SEM) detection, it demonstrates that OCT can become a new technological approach to detect subsurface morphologies of jades.