以闪光二号加速器为研究平台, 建立了微分环阵列和Rogowski线圈同时监测二极管电流的方法, 监测了二极管绝缘体表面的滑闪现象。根据电流探头测量结果的差异, 分析了绝缘体滑闪对电子束流参数的影响。二极管绝缘体出现滑闪, 位置附近的微分环波形严重畸变, 其它位置的微分环和Rogowski线圈测量结果基本一致。采用距离滑闪位置较远的微分环结果处理二极管束流参数, 相对于不出现滑闪时的结果, 束流强度和总能量没有明显的变化。绝缘体滑闪沿面局部放电, 能量损失较小, 尚未对电子束流造成较大影响。

A current diagnostic system included a B-dot array and a Rogowski coil was designed for the Flash-Ⅱ accelerator diode. Flashes on the insulator surface were monitored and their impact on the output of the diode was discussed based on the differences between the current probes. The waveforms of the B-dot near the position of flashes were distorted, and the waveforms of the other B-dots and the Rogowski coil accorded with those without flash. Compared with no flash situation, the electron beam intensity and energy of the diode, derived with measurements of the B-dot far away from the flash, did not reduce obviously. Flashes on the insulator surface were local discharges and had little impact on the output of high current diodes for the accelerators like Flash-Ⅱ accelerator．