为满足加速器束流诊断的特殊要求, 对束流面分布诊断方法进行了研究, 建立了一套基于荧光屏的离子束流面分布测量装置。采用Fen+(n=5~12)离子束流对测量装置进行了实验检验, 结果表明, 在几十至上百nA量级束流强度Fen+离子束的轰击下, 面分布图像产生了饱和现象。进一步的实验结果表明, 饱和现象是由荧光屏发光的光强过强造成的, 采用特别研制的具有光强衰减和滤波功能的成像光路可以解决光强饱和的问题。在低束流条件下, 面分布图像的灰度值与束流强度呈近似的线性关系, 对这种线性关系产生的原因进行了具体的分析。

Some techniques of beam profile measurements such as wire rotating scan, Faraday cups array and infrared imaging were investigated. A measurement device was built based on scintillating screen to cater for the demand of accelerator beam profile diagnostics. The device was bombarded under several tens to hundred nano-ampere Fen+(n=5-12) ion beam. The Fen+ ion beam experiment shows that the imaging saturation is mainly caused by light intensity rather than scintillating screen. A way to solve the saturation problem with a specially developed lens was mentioned. The grayscale of beam profile imaging is approximately linear with respect to the beam intensity, and the reason for formation of this relationship was analyzed.