半导体光电, 2013, 34 (3): 533, 网络出版: 2013-07-09  

基于4Q-PSD的高分辨率横向位移探测方法研究

Study of the Survey Method HighResolution Lateral Displacement Using 4Q-PSD
作者单位
山东理工大学 现代光电技术研究所,山东 淄博 255049
摘要
在分析四象限位置敏感器件(4QPSD)结构及特点的基础上,利用该器件作为核心探测器,设计了一种光电探测系统,对高分辨率横向位移的探测进行了研究。系统主要包括LED光发射、光接收、信号处理和显示等部分。LED发射的光束经聚焦透镜汇聚后射向反射镜,反射光聚焦到一个4QPSD上,经线性化的信号处理电路处理后,可实现高分辨率横向位移的测量。实验证明:横向位移测量稳定性与精度与测量距离无关,系统的误差主要来自反射镜反射的非均匀性。
Abstract
Based on analyzing the structure and characteristics of fourquadrant position sensitive detector, a photoelectric detection system was designed by using the device as the core detector, and then the detection of highresolution lateral displacement was studied. The system mainly consists of LED optical transmitter, optical receiver, signal processing and display part. The light beams emitting by LED were converged by the focusing lens shot at the mirror, and then the reflected light was focused to a fourquadrant position sensitive detector. Highresolution lateral displacement measurement can be achieved by the linearized signal processing circuit. Experimental results show that stability and accuracy of lateral displacement measurement has nothing to do with the measuring distance, and the detection errors mainly come from the reflected heterogeneity of the reflective film.

李田泽, 申晋, 盛翠霞, 杨淑连, 暴敏, 韩玉莹, 韩涛. 基于4Q-PSD的高分辨率横向位移探测方法研究[J]. 半导体光电, 2013, 34(3): 533. LI Tianze, SHEN Jin, SHENG Cuixia, YANG Shulian, BAO Min, HAN Yuying, HAN Tao. Study of the Survey Method HighResolution Lateral Displacement Using 4Q-PSD[J]. Semiconductor Optoelectronics, 2013, 34(3): 533.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!