Photonics Research, 2015, 3 (5): 05000283, Published Online: Jan. 6, 2016
Deep-UV fluorescence lifetime imaging microscopy Download: 849次
Abstract
A novel fluorescence lifetime imaging microscopy (FLIM) working with deep UV 240–280 nm wavelength excitations has been developed. UV-FLIM is used for measurement of defect-related fluorescence and its changes upon annealing from femtosecond laser-induced modifications in fused silica. This FLIM technique can be used with microfluidic and biosamples to characterize temporal characteristics of fluorescence upon UV excitation, a capability easily added to a standardmicroscope-based FLIM. UV-FLIMwas tested to show annealing of the defects induced by silica structuringwith ultrashort laser pulses. Frequency-domain fluorescencemeasurementswere converted into the time domain to extract long fluorescence lifetimes from defects in silica.
Christiaan J. de Jong, Alireza Lajevardipour, Mindaugas Gecevi?ius, Martynas Beresna, Gediminas Gervinskas, Peter G. Kazansky, Yves Bellouard, Andrew H. A. Clayton, Saulius Juodkazis. Deep-UV fluorescence lifetime imaging microscopy[J]. Photonics Research, 2015, 3(5): 05000283.