Optical performance of ultra-thin silver films under the attenuated total reflection mode

Ming ZHOU; Sheng ZHOU; Gang CHEN; Yaopeng LI; Dingquan LIU

doi:doi:10.1007/s12200-016-0574-7

Frontiers of Optoelectronics, 2016, 9 (4): 549–554, 网络出版: 2017-03-09

Optical performance of ultra-thin silver films under the attenuated total reflection mode

Ming ZHOU ^1,*Sheng ZHOU ¹Gang CHEN ¹Yaopeng LI ¹Dingquan LIU ^1,2

作者单位

¹ Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China

² School of Physical Science and Technology, ShanghaiTech University, Shanghai 200031, China

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Ming ZHOU, Sheng ZHOU, Gang CHEN, Yaopeng LI, Dingquan LIU. Optical performance of ultra-thin silver films under the attenuated total reflection mode[J]. Frontiers of Optoelectronics, 2016, 9(4): 549–554. Ming ZHOU, Sheng ZHOU, Gang CHEN, Yaopeng LI, Dingquan LIU. Optical performance of ultra-thin silver films under the attenuated total reflection mode[J]. Frontiers of Optoelectronics, 2016, 9(4): 549–554.

Optical performance of ultra-thin silver films under the attenuated total reflection mode

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