[1] Dekker A J. Secondary electron emission［J］. Solid State Physics, 1958, 6: 251-315.

[2] Bruining H. Physics and applications of secondary electron emission ［M］. Oxford: Pergamon Press, 1954.

[3] 谢爱根.二次电子发射的研究和二次电子发射系数的测量［D］. 合肥:中国科学技术大学, 2005.(Xie Aigen. Research of secondary electron emission and measurement of secondary electron yield. Hefei: University of Science and Technology of China, 2005)

[4] Zameroski N D, Prashanth Kumar, Christopher Watts, et al. Secondary electron yield measurements from materials with application to collectors of high-power microwave devices［J］. IEEE Trans Plasma Sci, 2006, 34(3): 642-651.

[5] Vaughan J R. Multipactor［J］. IEEE Trans Electron Devices, 1988, 35(7): 1172-1180.

[6] Vaughan J R. New formula for secondary emission yield［J］. IEEE Trans Electron Devices, 1989, 36(9): 1963-1967.

[7] Vaughan J R. Secondary emission formulas［J］. IEEE Trans Electron Devices, 1993, 40(4): 830-830.

[8] Furman M A, Lambertson G R. The electron-cloud instability in the arcs of the PEP-Ⅱ positron ring［R］. Proc Intl Workshop on Multi-bunch Instabilities in Future Electron and Positron Accelerators (MBI-97), KEK, Tsukuba, Japan, 1997.

[9] Furman M A, Pivi M T. Simulation of secondary electron emission based on a phenomenological probabilistic model［R］. LBNL-52807, 2003.

[10] Lye R G, Dekker A J. Theory of secondary emission［J］. Phys Rev, 1957, 107: 977-981.

[11] Salehi M, Flinn E A. Dependence of secondary-electron emission from amorphous materials on primary angle of incidence［J］. Journal Appl Phys, 1981, 52: 994-996.

[12] Bouchard C, Carette J D. The secondary electron emission coefficient of disordered surfaces ［J］. Surface Sci, 1980, 100: 241-250.

[13] 董烨,董志伟,杨温渊. 金属双边二次电子倍增的理论分析与数值模拟［J］.强激光与粒子束, 2011, 23(2): 454-462.(Dong Ye, Dong Zhiwei, Yang Wenyuan. Theoretic analysis and numerical simulation of metal two-sided multipactor discharge. High Power Laser and Particle Beams, 2011, 23(2): 454-462)

[14] Milton Abramowitz， Irene Anne Stegun. Handbook of mathematical functions［M］. 9th ed. Dover Publications Inc, 1970.