Chinese Optics Letters, 2005, 3 (7): 07425, Published Online: Jun. 6, 2006  

Investigation of ultra-short-period W/C multilayers for soft X-ray optics

Author Affiliations
Institute of Precision Optical Engineering, Tongji University, Shanghai 200092
Abstract
Ultra-short-period W/C multilayers having periodic thickness range of 1.15---3.01 nm have been fabricated for soft X-ray optics using the high vacuum direct current (DC) magnetron sputtering system. These multilayers were characterized by low-angle X-ray diffraction (LAXRD) and transmission electron microscope (TEM). The results show that the multilayer thin films with periodic thickness more than 1.5 nm have clear W-C interface and low roughness. But the structure of the periodic thickness below 1.5 nm is not clear. Finally, three ways to improve the performance of the multilayers are suggested.
References

[1] A. M. Haeryluk and L. G. Seppala, J. Vac. Sci. Technol. B 6, 2162 (1988).

[2] D. L. Shealy, R. B. Hoover, T. R. Barbee, and A. B. C. Walker, Opt. Eng. 29, 721 (1990).

[3] L. Golub, M. Herant, K. Kalata, I. Lovas, G. Nystrom, F. Pardo, E. Spiller, and J. Wilczynski, Nature 344, 842 (1990).

[4] A. F. Jankowski and D. M. Makowiecki, Proc. SPIE 984, 64 (1988).

[5] A. F. Jankowski, L. R. Schrawyer, M. A. Wall, W. W. Craig, R. I. Morales, and D. M. Makowiecki, J. Vac. Sci. Technol. A 7, 2914 (1989).

[6] D. L. Windt, E. M. Gullikson, and C. C. Walton, Opt. Lett. 27, 2212 (2002).

[7] J. F. Seely, G. Gutman, J. Wood, G. S. Herman, M. P. Kowalski, J. C. Rife, and W. R. Hunter, Appl. Opt. 32, 3541 (1993).

[8] A. F. Jankowski, Opt. Eng. 29, 968 (1990).

[9] E. Spiller and L. Golub, Appl. Opt. 28, 2969 (1989).

[10] M. Arbaoui, R. Barchewitz, C. Sella, and K. B. Youn, Appl. Opt. 29, 477 (1990).

[11] Z. Jiang, V. Dupuis, B. Vidal, M. F. Ravet, and M. Piecuch, J. Appl. Phys. 72, 931 (1992).

[12] D. G. Stearns, R. S. Rosen, and S. P. Vernon, Opt. Lett. 16, 1283 (1991).

[13] D. G. Stearns, R. S. Rosen, and S. P. Vernon, J. Vac. Sci. Technol. A 9, 2662 (1991).

[14] A. E. Yakshin, I. I. Khodos, I. M. Zhelezniak, and A. I. Erko, Opt. Commun. 118, 133 (1995).

[15] P. F. Miceli, D. A. Neumann, and H. Zabel, Appl. Phys. Lett. 48, 24 (1986).

Fengli Wang, Zhanshan Wang, Shuji Qin, Wenjuan Wu, Zhong Zhang, Hongchang Wang, Lingyan Chen. Investigation of ultra-short-period W/C multilayers for soft X-ray optics[J]. Chinese Optics Letters, 2005, 3(7): 07425.

关于本站 Cookie 的使用提示

中国光学期刊网使用基于 cookie 的技术来更好地为您提供各项服务,点击此处了解我们的隐私策略。 如您需继续使用本网站,请您授权我们使用本地 cookie 来保存部分信息。
全站搜索
您最值得信赖的光电行业旗舰网络服务平台!