中国激光, 1996, 23 (8): 697, 网络出版: 2006-12-04
采用双相位共轭干涉法测定光折晶体中折射率光栅相移的原理
Determination of Refractive-index Grating Phase Shift in Photorefractive Crystal with a Double Phase Conjugate Interferometer
光致折变效应 三次非线性极化率 光学相位共轭干涉仪 photorefractive effect third-order nonlinear susceptibility optical phase conjugate interferometer
摘要
在理论上证实了采用双相位干涉法直接测定光折晶体内折射率光栅相对于光强分布的相位移和非线性介质三次非线性极化率相位的可能性。
Abstract
A simple method to determine the refractive-index grating phase shift versus the intensity distribution pattern in a photorefractive crystal and the third-order susceptivility's phase of a nonlinear medium with a double phase conjugate interferometer is explained theoretically.
参考文献
杜卫冲, 刘颂豪. 采用双相位共轭干涉法测定光折晶体中折射率光栅相移的原理[J]. 中国激光, 1996, 23(8): 697. 杜卫冲, 刘颂豪. Determination of Refractive-index Grating Phase Shift in Photorefractive Crystal with a Double Phase Conjugate Interferometer[J]. Chinese Journal of Lasers, 1996, 23(8): 697.
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