二维光电水平倾角测量系统
[1] CUI C X, FENG Q B, ZHANG B. Compensation for straightness measurement systematic errors in six degree-of-freedom motion error simultaneous measurement system[J]. Applied Optics, 2015, 54(11): 3122-3131.
[2] GAO W, HUANG P S, YAMADA T, et al.. A compact and sensitive two-dimensional angle probe for flatness measurement of large silicon wafers[J]. Precision Engineering, 2002, 26(4): 396-404.
[3] 刘先一, 周召发, 张志利, 等. 数字天顶仪中倾角仪参数的标定[J]. 光学 精密工程, 2016, 24(9): 2325-2331.
[4] 王向军, 曹雨, 周凯. 二维合作目标的单相机空间位姿测量方法[J]. 光学 精密工程, 2017, 25(1): 274-280.
[5] FAN K C, WANG T H, LIN S Y, et al.. Design of a dual-axis optoelectronic level for precision angle measurements[J]. Measurement Science and Technology, 2011, 22(5): 055302.
[6] FAN K C, WANG T H, LIU Y C, et al.. Development of a dual-axis optoelectronic precision level[J]. Proceedings of SPIE-The International Society for Optical Engineering, 2011, 8321:83213H.
[7] CHENG F, FAN K C. High-resolution angle measurement based on michelson interferometry[J]. Physics Procedia, 2011, 19: 3-8.
[8] WANG B G. Study on a new high accuracy dual-axis electronic level[J]. Acta Metrologica Sinica, 1998, 19(1): 22-27.
[9] 孙国燕, 高立民, 白建明, 等. 三维姿态角高精度测量装置[J]. 光学 精密工程, 2016, 24(5): 963-970.
[10] 赵振庆, 叶东, 张鑫, 等. 改进的精密测角法标定面阵摄像机参数[J]. 光学 精密工程, 2016, 24(7): 1592-1599.
[11] 丁健生, 史国权, 石广丰. 基于图像清晰度检测的光栅刻划平台调平装置[J]. 光学 精密工程, 2016, 24(4): 819-825.
[12] 杨中光, 周军, 黄河, 等. 偏振导航传感器测角误差分析与补偿[J]. 光学 精密工程, 2014, 22(6): 1424-1429.
[13] 黄梅珍. 位置敏感探测器的研究[D]. 杭州: 浙江大学, 2001.
HUANG M ZH. Study on position sensitive detector[D]. Hangzhou: Zhejiang University, 2001. (in Chinese)
[14] 安毓英. 曾晓东. 光电探测原理[M]. 西安: 西安电子科技大学出版社, 2004.
AN Y Y, ZENG X D. Principle of Photoelectric Detector[M]. Xi’an: Xidian University Press, 2004. (in Chinese)
王洪远, 段发阶, 蒋佳佳, 张聪. 二维光电水平倾角测量系统[J]. 光学 精密工程, 2017, 25(12): 3120. WANG Hong-yuan, DUAN Fa-jie, JIANG Jia-jia, ZHANG Cong. A two-dimensional photoelectric level inclination measuring system[J]. Optics and Precision Engineering, 2017, 25(12): 3120.