Photonics Research, 2016, 4 (3): 03000115, Published Online: Sep. 29, 2016  

Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector Download: 640次

Author Affiliations
1 College of Communication and Art Design, University of Shanghai for Science and Technology, Shanghai 200093, China
2 School of Optical Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
3 Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai 201800, China
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Leihong Zhang, Dong Liang, Bei Li, Yi Kang, Zilan Pan, Dawei Zhang, Xiuhua Ma. Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector[J]. Photonics Research, 2016, 4(3): 03000115.

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