Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector

Leihong Zhang; Dong Liang; Bei Li; Yi Kang; Zilan Pan; Dawei Zhang; Xiuhua Ma

doi:doi:10.1364/prj.4.000115

Photonics Research, 2016, 4 (3): 03000115, Published Online: Sep. 29, 2016

Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector Download： 641次

Leihong Zhang ¹Dong Liang ¹Bei Li ¹Yi Kang ¹Zilan Pan ¹Dawei Zhang ^2,*Xiuhua Ma ³

Author Affiliations

¹ College of Communication and Art Design, University of Shanghai for Science and Technology, Shanghai 200093, China

² School of Optical Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China

³ Shanghai Institute of Optics and Fine Mechanics, CAS, Shanghai 201800, China

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Leihong Zhang, Dong Liang, Bei Li, Yi Kang, Zilan Pan, Dawei Zhang, Xiuhua Ma. Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector[J]. Photonics Research, 2016, 4(3): 03000115.

Study on the key technology of spectral reflectivity reconstruction based on sparse prior by a single-pixel detector Download： 641次

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