发光学报, 2019, 40 (6): 815, 网络出版: 2019-09-03   

飞秒脉冲激光辐照FRAM诱发的毁伤效应及热演化

Damage Effects and Thermal Evolution of FRAM Irradiated by Femtosecond Pulsed Laser
作者单位
沈阳理工大学 装备工程学院, 辽宁 沈阳 110159
摘要
空间高能粒子辐照航天器电子器件诱发的毁伤和热演化特征, 直接关系到航天器的在轨安全运行和在轨任务的顺利实施。本文利用自行构建的飞秒脉冲激光辐照系统、激光诱发毁伤的数据采集系统、数据读写系统和红外热成像系统, 开展了不同激光输出重复频率、不同作用区域下辐照铁电存储器(FRAM)实验, 获取激光辐照于铁电存储器被照面的稳态温度场和铁电存储器的暂态失效和永久失效出现时间, 并观测了辐射效应对铁电存储器的毁伤效果, 经MATLAB软件处理得到了激光辐照铁电存储器不同区域热演化过程的温度场分布。实验结果表明: 在激光输出功率近似相同的飞秒脉冲激光辐照条件下, 激光脉冲输出重复频率越低, 诱发永久性毁伤出现时刻的时间越长, 近似呈非线性增长; 随着激光输出重复频率的增大, 激光对铁电存储器的作用由激光电离存储器介质产生的高能带电粒子对铁电体自发极化的破坏为主, 逐步转变为以热辐射与热应力诱发的毁伤; 当激光在器件表面产生的最高温度接近存储器最高工作温度时, 永久毁伤的出现时间将显著延长。并通过对回归参数的计算和假设检验, 给出了回归参数的置信度1-α为95%的条件下激光辐照区域1与区域2的最高辐射温度与激光输出重复频率的拟合关系式。
Abstract
Damage effects and thermal evolution characteristics induced by space high-energy particles to spacecraft electronic devices are directly related to the safe operation of spacecraft and on-orbit tasks. In this paper, self-constructed femtosecond pulsed laser irradiation system, laser induced damage effect data acquisition system, data write-read system and infrared thermal imaging system were used to carry out different laser output frequencies and different areas of irradiated ferromagnetic random access memory(FRAM). Under the conditions, experiments were carried out to obtain the steady-state temperature field of the irradiated surface of the FRAM and the time of transient failure and permanent failure of the FRAM, and damage effect and thermal evolution on the FRAM were observed. The data were processed by MATLAB software. The temperature distribution of the thermal evolution process in different areas of the laser irradiated FRAM was obtained. The results show that the laser pulse output power is approximately the same under the conditions of femtosecond pulsed laser irradiation, the lower the laser pulse output frequency, the longer the moment of permanent damage induced, the longer the nonlinear growth; with the laser output frequency increasing, the effect of the laser on the FRAM, induced by the high-energy charged particles generated by the laser ionization memory medium mainly destroys the spontaneous polarization of the ferroelectrics, and gradually transforms into the damage induced by thermal radiation and thermal stress. When the maximum temperature produced by the laser on the surface of the device is close to the highest working temperature of the memory, the time of permanent damage will be significantly prolonged. Through the calculation of the regression parameters and the hypothesis test, the fitting relationship between the maximum radiation temperature and the laser output frequency of laser irradiation area 1 and area 2 is given, under the condition that the confidence degree 1-α is 95%.
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乔相信, 成艺光, 唐恩凌, 韩雅菲. 飞秒脉冲激光辐照FRAM诱发的毁伤效应及热演化[J]. 发光学报, 2019, 40(6): 815. QIAO Xiang-xin, CHENG Yi-guang, TANG En-ling, HAN Ya-fei. Damage Effects and Thermal Evolution of FRAM Irradiated by Femtosecond Pulsed Laser[J]. Chinese Journal of Luminescence, 2019, 40(6): 815.

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