半导体光子学与技术, 2007, 13 (1): 33, 网络出版: 2011-08-18
Intelligent Camera for Surface Defect Inspection
Intelligent Camera for Surface Defect Inspection
补充材料
CHENG Wan-sheng, ZHAO Jie, WANG Ke-cheng. Intelligent Camera for Surface Defect Inspection[J]. 半导体光子学与技术, 2007, 13(1): 33. CHENG Wan-sheng, ZHAO Jie, WANG Ke-cheng. Intelligent Camera for Surface Defect Inspection[J]. Semiconductor Photonics and Technology, 2007, 13(1): 33.