微小卫星单粒子闩锁防护技术研究
[1] Becker H N, Miyahira T F, Johnston A H. Latent damage in CMOS devices from single-event latchup[J]. Nuclear Science, IEEE Transactions on, 2002, 49(6): 3009-3015.
[2] Wang Changhe. The influence with reliability of motional satellite by the single-event phenomena[J]. Semiconductor Intelligence, 1998, 35(1): 1-8. (in Chinese)
[3] Zhang Xiaoping. The analysis and design of radiation-hardened CMOS integrated circuits[D]. Xi′an: Xi′an University of Technology, 2003. (in Chinese)
[4] Song Qinqi. Single-particle effect and hardening of CMOS devices[J]. Atomic Energy Science and Technology, 1997, 31(3): 250-257. (in Chinese)
[5] Li Yi, Li Rui, Huang Ying, et al. The implement of Single Event Latchup protection technology in space information processing system based on COTS[J]. Journal of Astronautics, 2007, 28(5): 1283-1287. (in Chinese)
[6] He Chaohui, Geng Bin, Li Yonghong, et al. Measurement system of single event latehup radiation effects for very large scale integrated circuits[J]. Nuclear Electronics and Detection Technology, 2005, 25(6): 724-728. (in Chinese)
[7] Yang Shiyu, Cao Zhou, Xue Yuxiong. Research on the single event latchup in the space and it′s protection technology[J]. Nuclear Electronics and Detection Technology, 2007, 27(3): 567-570. (in Chinese)
[8] Wang Yunhui, Yu Zongguang, Sun Zaiji. Electronic Component Reliability Design [M]. Beijing: Science Press, 2007. (in Chinese)
[9] Layton P J, Czajkowski D R, Marshall J C, et al. Single event latchup protection of integrated circuits[C]//Fourth European Conference on Radiation and its Effects on Components and Systems, 1997.
[10] Dodds N A, Hooten N C, Reed R A, et al. Effectiveness of SEL Hardening Strategies and the Latchup Domino Effect[J]. Nuclear Science, IEEE Transactions on, 2012, 59(6): 2642-2650.
张昊, 王新升, 李博, 周开兴, 陈德祥. 微小卫星单粒子闩锁防护技术研究[J]. 红外与激光工程, 2015, 44(5): 1444. Zhang Hao, Wang Xinsheng, Li Bo, Zhou Kaixing, Chen Dexiang. Research on Single Event Latchup protection technology for micro-satellite[J]. Infrared and Laser Engineering, 2015, 44(5): 1444.