Snapshot imaging spectrometer based on a microlens array

Zexia Zhang; Jun Chang; Hongxi Ren; Kaiyuan Fan; Dongmei Li

doi:doi:10.3788/COL201917.011101

Chinese Optics Letters, 2019, 17 (1): 011101, Published Online: Jan. 17, 2019

Snapshot imaging spectrometer based on a microlens array Download： 838次

Zexia Zhang ^1,*Jun Chang ^1,**Hongxi Ren ¹Kaiyuan Fan ¹Dongmei Li ^2,3

Author Affiliations

¹ School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China

² University of Chinese Academy of Sciences, Beijing 100853, China

³ Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China

Figures & Tables

Fig. 1. System schematic diagram. The imaging process of a data cube, and its procedure of the down sampling and dispersive optical model.

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Fig. 2. Detailed structure of the microlens array.

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Fig. 3. Simulated diagrams of the system in Zemax. (a) The 2D layout of the final optical system. (b) The spot diagram of the system for different fields of view and different wavelengths.

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Fig. 4. F number match diagram. (a) The F number of the objective is greater than the microlens F number, which causes gaps. (b) The F number of the objective lens is less than the microlens F number, which causes overlaps.

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Fig. 5. Image plane before and after rotating 45°.

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Fig. 6. Diagram of the experimental setup. (a) The overall view of the setup. (b) The inside details of the key parts.

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Fig. 7. Images of the whiteboard at different wavelengths. (a) 514.5 nm. (b) 560 nm. (c) 632.8 nm.

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Fig. 8. Experimental result. (a) The original graph. (b) The image of the original graph through the system.

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Fig. 9. Relationship between the wavelength and the pixel position.

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Fig. 10. Images at different wavelengths after processing. The wavelength is from 350.67 to 770.21 nm, and the spectral interval is about 10 nm.

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Zexia Zhang, Jun Chang, Hongxi Ren, Kaiyuan Fan, Dongmei Li. Snapshot imaging spectrometer based on a microlens array[J]. Chinese Optics Letters, 2019, 17(1): 011101.

Snapshot imaging spectrometer based on a microlens array Download： 838次

Fig. 1. System schematic diagram. The imaging process of a data cube, and its procedure of the down sampling and dispersive optical model.

Fig. 2. Detailed structure of the microlens array.

Fig. 3. Simulated diagrams of the system in Zemax. (a) The 2D layout of the final optical system. (b) The spot diagram of the system for different fields of view and different wavelengths.

Fig. 4. F number match diagram. (a) The F number of the objective is greater than the microlens F number, which causes gaps. (b) The F number of the objective lens is less than the microlens F number, which causes overlaps.

Fig. 5. Image plane before and after rotating 45°.

Fig. 6. Diagram of the experimental setup. (a) The overall view of the setup. (b) The inside details of the key parts.

Fig. 7. Images of the whiteboard at different wavelengths. (a) 514.5 nm. (b) 560 nm. (c) 632.8 nm.

Fig. 8. Experimental result. (a) The original graph. (b) The image of the original graph through the system.

Fig. 9. Relationship between the wavelength and the pixel position.

Fig. 10. Images at different wavelengths after processing. The wavelength is from 350.67 to 770.21 nm, and the spectral interval is about 10 nm.

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Snapshot imaging spectrometer based on a microlens array Download： 838次

Fig. 1. System schematic diagram. The imaging process of a data cube, and its procedure of the down sampling and dispersive optical model.

Fig. 2. Detailed structure of the microlens array.

Fig. 3. Simulated diagrams of the system in Zemax. (a) The 2D layout of the final optical system. (b) The spot diagram of the system for different fields of view and different wavelengths.

Fig. 4. F number match diagram. (a) The F number of the objective is greater than the microlens F number, which causes gaps. (b) The F number of the objective lens is less than the microlens F number, which causes overlaps.

Fig. 5. Image plane before and after rotating 45°.

Fig. 6. Diagram of the experimental setup. (a) The overall view of the setup. (b) The inside details of the key parts.

Fig. 7. Images of the whiteboard at different wavelengths. (a) 514.5 nm. (b) 560 nm. (c) 632.8 nm.

Fig. 8. Experimental result. (a) The original graph. (b) The image of the original graph through the system.

Fig. 9. Relationship between the wavelength and the pixel position.

Fig. 10. Images at different wavelengths after processing. The wavelength is from 350.67 to 770.21 nm, and the spectral interval is about 10 nm.

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