定标漫反射板实验室系统级BRDF测量方法

李明; 宗肖颖

doi:doi:10.3788/irla201746.0117004

红外与激光工程, 2017, 46 (1): 0117004, 网络出版: 2017-03-29

定标漫反射板实验室系统级BRDF测量方法

In-lab system-level BRDF measurement method of calibration diffuser

论文大纲

李明 ^*宗肖颖

作者单位

北京空间机电研究所, 北京100190

漫反射板星上定标系统辐射定标 diffuser BRDF BRDF on-board calibration unit radiometric calibration

摘要

星上定标系统是卫星遥感器的重要组成部分, 用于实现仪器的星上辐射定标等功能。介绍了安装在某一时间调制型傅里叶变换光谱仪上的星上定标系统, 该星上定标系统采用漫反射板太阳辐射定标方法进行仪器在轨全口径、全光路、全视场的星上辐射定标。定标漫反射板在光谱仪光路最前端反射太阳光, 通过已知的大气外太阳照度和漫反射板的双向反射分布函数BRDF确立辐亮度标准。定标漫反射板的BRDF需要在实验室进行精确测量。介绍了在光谱仪整机状态下使用太阳模拟器和标准漫反射板进行定标漫反射板实验室系统级BRDF测量的方法, 对使用定标漫反射板系统级BRDF进行星上辐射定标时的绝对辐射定标精度进行了分析, 绝对辐射定标精度能够满足≤5%的指标要求。

Abstract

The on-board calibration unit is an important part of the space-borne remote sensor and used to achieve the on-board radiometric calibration and other functions. An on-board calibration unit installed on a time-modulated fourier transform spectrometer was introduced. Used the sun as the light source to illuminate the calibration diffuser, the on-board calibration unit carries out the on-board radiometric calibration of the spectrometer in the full aperture, the full optical path and the full field of view. The calibration diffuser was in the front of the optical path of the spectrometer to reflect the sunlight and the standard radiance was obtained by used the known exoatmospheric solar irradiance and the BRDF(bidirectional reflectance distribution function) of the calibration diffuser. The BRDF of the calibration diffuser needs to be measured accurately in the lab. With the whole spectrometer, using the sun simulator and the standard diffuser, the in-lab system-level BRDF test method of the calibration diffuser was introduced. While using the system-level BRDF of the calibration diffuser, the accuracy of the on-board absolute radiometric calibration was analyzed and can satisfy the requirement of ≤5%.

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李明, 宗肖颖. 定标漫反射板实验室系统级BRDF测量方法[J]. 红外与激光工程, 2017, 46(1): 0117004. Li Ming, Zong Xiaoying. In-lab system-level BRDF measurement method of calibration diffuser[J]. Infrared and Laser Engineering, 2017, 46(1): 0117004.

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