液晶与显示, 2020, 35 (2): 108, 网络出版: 2020-03-26   

用于液晶盒表面面形检测的短相干载频干涉方法

Low coherence carrier frequency interference method for measurement of the liquid crystal cell surface
作者单位
1 南京理工大学 先进发射协同创新中心, 江苏 南京 210094
2 南京理工大学 电子工程与光电技术学院, 江苏 南京 210094
引用该论文

杨光, 陈磊, 胡晨辉, 张正宇, 朱文华. 用于液晶盒表面面形检测的短相干载频干涉方法[J]. 液晶与显示, 2020, 35(2): 108.

YANG Guang, CHEN Lei, HU Chen-hui, ZHANG Zheng-yu, ZHU Wen-hua. Low coherence carrier frequency interference method for measurement of the liquid crystal cell surface[J]. Chinese Journal of Liquid Crystals and Displays, 2020, 35(2): 108.

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杨光, 陈磊, 胡晨辉, 张正宇, 朱文华. 用于液晶盒表面面形检测的短相干载频干涉方法[J]. 液晶与显示, 2020, 35(2): 108. YANG Guang, CHEN Lei, HU Chen-hui, ZHANG Zheng-yu, ZHU Wen-hua. Low coherence carrier frequency interference method for measurement of the liquid crystal cell surface[J]. Chinese Journal of Liquid Crystals and Displays, 2020, 35(2): 108.

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