标准漫反射板绝对反射比因子测量装置
[1] 王淑荣,邢进,李福田. 利用积分球光源定标空间紫外遥感光谱辐射计[J]. 光学 精密工程,2006,14(2):185-190.
[2] 王锐,宋克非. 高精度紫外探测器辐射定标系统[J]. 光学 精密工程,2009,17(3):469-474.
[3] 冯志庆, 王淑荣, 王晓君,等. PDP荧光粉的相对亮度与VUV激发光谱的测量[J].光学 精密工程,2008,16(1):59-63.
[4] NICODEMUS F E,RICHMOND J C,HSIA J J,et al.. Geometrical Considerations and Nomenclature for Reflectance[R]. NIST Monograph 1977:160.
[5] 杨本永,张黎明,沈政国,等. 光学传感器星上定标漫射板的特性测量[J]. 光学 精密工程, 2009, 17(8): 1851-1858.
[6] . NBS 45°normal reflectometer for absolute reflectance factors[J]. Metro, 1981, 17: 97-102.
[7] . Near infrared 45°/0° reflectance factor of pressed polytetrafluoroethylene (PTFE) powder[J]. J. Res. Natl. Inst. Stand. Technol., 1999, 104: 185-188.
[8] YVONNE B P,HSIA J J. 45°/0° Reflectance Factors of Pressed Polytetrafluoroethylene (PTFE) powder[C]. NIST Technical Note, 1995, 1413-1417.
[9] Commission International de l’eclairage. International Lighting Vocabulary [M]. CIE Publ.,1987.
[10] . High accuracy measurement of aperture area relative to a standard known aperture[J]. J. Res. Natl. Inst. Stand.Technol, 1995, 100(3): 277-283.
[11] 盛建军,张黎明,郑小兵,等. 精确测量孔径光阑面积的光学方法[J]. 红外与激光工程,2008,37:534-537.
SHENG J J, ZHANG L M, ZHENG X B, et al..Optical method for accurate measurement on the area of aperture diaphragm[J]. Infrared and Laser Engineering, 2008,37(3):534-537.(in Chinese)
盛建军, 张黎明. 标准漫反射板绝对反射比因子测量装置[J]. 光学 精密工程, 2010, 18(7): 1498. SHENG Jian-jun, ZHANG Li-ming. Reflectometer for absolute reflectance factor of standard diffuse panel[J]. Optics and Precision Engineering, 2010, 18(7): 1498.