[1] 高如新，任晓朵，吴献，等．基于图像处理的手机屏幕缺陷检测系统研究［J］．测控技术，2017，36(4)：26-30．

    GAO R X, REN X D, WU X, et al. Research on mobile phone screen defect detection system based on image processing ［J］. Measurement & Control Technology, 2017, 36(4): 26-30. (in Chinese)

[2] CEN Y G, ZHAO R Z, CEN L H, et al. Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction［J］. Neurocomputing, 2015, 149: 1206-1215.

[3] 刘波，李新华，钱翔，等．手机屏幕图像缺陷的实时检测［J］．计算机工程与应用，2010，46(28)：77-79．

    LIU B, LI X H, QIAN X, et al. Real time detection of image defect for phone LCD screen ［J］. Computer Engineering and Applications, 2010, 46(28): 77-79. (in Chinese)

[4] FAN S K S, CHUANG Y C. Automatic detection of Mura defect in TFT-LCD based on regression diagnostics ［J］. Pattern Recognition Letters, 2010, 31(15): 2397-2404.

[5] JIANC X, CAO J, AO Y H. Automatic surface defect detection for mobile phone screen glass based on machine vision ［J］. Applied Soft Computing, 2017, 52: 348-358.

[6] 温招洋，周亚丽，张奇志．基于DCT和Otsu的LCD缺陷检测算法［J］．北京信息科技大学学报：自然科学版，2017，32(2)：50-54．

    WEN Z Y, ZHOU Y L, ZHANG Q Z. Defect detection algorithm of LCD based on DCT and Otsu ［J］. Journal of Beijing Information Science ＆ Technology University, 2017, 32(2): 50-54. (in Chinese)

[7] GUE, PARK K H, LEE J H, et al. TFT-LCD defect detection based on histogram distribution modeling ［J］. Journal of Korea Multimedia Society, 2015, 18(12): 1519-1527.

[8] GU E, PARK K H. Defect Detection algorithm of TFT-LCD polarizing film using the probability density function based on cluster characteristic ［J］. Journal of Korea Multimedia Society, 2016, 19(3): 633-641.

[9] WANG X, DONG R, LI B. TFT-LCD Mura defect detection based on ICA and multi-channels fusion ［C］//Proceedings of 3rd International Conference on Information Science and Control Engineering. Beijing, China: IEEE, 2016: 687-691.

[10] 许祖鑫，毕明德，孙志刚．基于数学形态学的手机屏缺陷检测算法设计［J］．电气自动化，2013，35(3)：99-101,105．

    XU Z X, BI M D, SUN Z G. Design of defect inspection algorithm for mobile screen based on mathematical morphology ［J］. Electrical Automation, 2013, 35(3): 99-101, 105. (in Chinese)

[11] 刘毅，郑学仁，王亚南，等．MATLAB在TFT-LCD屏显示MURA缺陷检测的应用［J］．液晶与显示，2007，22(6)：731-736．

    LIU Y, ZHENG X R, WANG Y N, et al. Application of MATLAB in TFT-LCD’s MURA defect detection ［J］. Chinese Journal of Liquid Crystals and Displays, 2007, 22(6): 731-736. (in Chinese)

[12] OTSU N. A threshold selection method from gray-level histograms ［J］. IEEE Transactions on Systems, Man, and Cybernetics, 1979, 9(1): 62-66.