国产非制冷红外探测器新型场景校正方法

刘品伟; 侯良科; 胡志强; 房海松

光学与光电技术, 2023, 21 (6): 0090, 网络出版: 2024-02-29

国产非制冷红外探测器新型场景校正方法

A New Scene Correction Method for Domestic Uncooled Infrared Detectors

论文大纲

刘品伟侯良科胡志强房海松

作者单位

湖北久之洋红外系统股份有限公司, 湖北武汉 430223

非制冷红外非均匀校正红外成像系统场景校正非均匀性 uncooled infrared non-uniformity correction infrared imaging system scene correction non-uniformity

摘要

现有国产非制冷红外探测器多采用挡板校正进行非均匀性校正, 影响了红外探测器的观测效果与目标搜跟。为了拓展红外探测器的应用方向与领域, 提出了一种国产非制冷红外探测器新型场景校正方法, 通过改进的神经网络场景校正方法去除高频非均匀性, 再通过时空联合的低频滤波去除低频非均匀性。应用该方法的某国产非制冷红外机芯, 工作1 h后图像非均匀性为0.5%。该方法具有良好的校正效果, 并且能够有效地抑制“鬼影”现象, 有利于减少红外成像系统的体积与功耗, 有利于国产非制冷红外探测器在航天、航空、**装备等多领域的应用。

Abstract

The existing domestic vanadium oxide uncooled infrared detectors mostly use baffle correction for nonuniformity correction, which leads to complex structure and image interruption, thus affecting the normal use of the detector. In order to expand the usage direction and field of infrared detectors, a new non-uniformity correction method without baffle is proposed in this paper, which combines the non-uniformity correction method based on calibration correction and scene correction to realize the non baffle correction of uncooled infrared detector. The image non-uniformity of a domestic uncooled infrared imaging system using this method is 0.5% after one hour of operation. Experimental results show that this method can achieve nonuniformity correction quickly after the start of correction, and the correction effect is good, and there is no “ghost” problem existing in traditional scene correction methods. This method avoids the image interruption of the infrared imaging system, and helps to reduce the volume and power consumption of the infrared imaging system, and helps for the application of domestic uncooled infrared detectors in various fields such as aerospace, aviation, and weapon equipment.

参考文献

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刘品伟, 侯良科, 胡志强, 房海松. 国产非制冷红外探测器新型场景校正方法[J]. 光学与光电技术, 2023, 21(6): 0090. LIU Pin-wei, HOU Liang-ke, HU Zhi-qiang, FANG Hai-song. A New Scene Correction Method for Domestic Uncooled Infrared Detectors[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2023, 21(6): 0090.

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