应用光学, 2014, 35 (3): 446, 网络出版: 2014-06-03  

基于俯视SEM图像的矩形光栅占宽比检测方法

Measurement method for duty cycles of rectangular gratings based on top-down SEM images
作者单位
中国科学技术大学 国家同步辐射实验室,安徽 合肥 230029
引用该论文

吴丽翔, 刘颖, 饶欢乐, 邱克强, 付绍军. 基于俯视SEM图像的矩形光栅占宽比检测方法[J]. 应用光学, 2014, 35(3): 446.

WU Li-xiang, LIU Ying, RAO Huan-le, QIU Ke-qiang, FU Shao-jun. Measurement method for duty cycles of rectangular gratings based on top-down SEM images[J]. Journal of Applied Optics, 2014, 35(3): 446.

参考文献

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    XIA Xiao-bin. Research on measurement of duty cycles of Cr-mask in the fabrication process of beam sampling grating [D]. Suzhou: Soochow University, 2012. (in Chinese with an English abstract )

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吴丽翔, 刘颖, 饶欢乐, 邱克强, 付绍军. 基于俯视SEM图像的矩形光栅占宽比检测方法[J]. 应用光学, 2014, 35(3): 446. WU Li-xiang, LIU Ying, RAO Huan-le, QIU Ke-qiang, FU Shao-jun. Measurement method for duty cycles of rectangular gratings based on top-down SEM images[J]. Journal of Applied Optics, 2014, 35(3): 446.

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