光学学报, 1989, 9 (8): 741, 网络出版: 2011-09-20
光学薄膜吸收损耗的研究
Absorption losses in single layer optical coatings
摘要
用横向光热偏转技术研究光学薄膜的吸收损耗.结果表明:对ZrO2、MgF2、ZnS等单层膜,薄膜-基底界面吸收、空气-薄膜界面吸收以及薄膜体内吸收三者处于同一量级,而对TiO2、Ta2O5、SiO2等样品,薄膜-基底界面吸收远大于空气-薄膜界面吸收及薄膜体内吸收,是吸收损耗的主要来源.
Abstract
Absorption measurements performed by means of transverse photothermal deflection technique for wedge-shaped ZrO2, MgF2, ZnS, TiO2, Ta2O5 and SiO2 single-layer films at λ=6328 A permits a separation of bulk and interface absorption. Experimental results show that for ZrO2, MgF2 and ZnS films investigated, the film-substrate interface absorption and the air-film intterfaoe absorption are nearly the same, while for TiO2, Ta2O5 and SiO2 films, the film-substrate interface absorption dominates over the air-film interfaoe absorption, being the main source of tlie total a Sorption loss.
吴周令, 范正修, 唐晋发. 光学薄膜吸收损耗的研究[J]. 光学学报, 1989, 9(8): 741. WU ZHOULING, FAN ZHENGXIU, TANG JINFA. Absorption losses in single layer optical coatings[J]. Acta Optica Sinica, 1989, 9(8): 741.
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