傅里叶叠层显微术的照明光强校正研究

杨佳琪; 马骁; 林锦新; 钟金钢

doi:doi:10.3788/lop54.031101

激光与光电子学进展, 2017, 54 (3): 031101, 网络出版: 2017-03-08

傅里叶叠层显微术的照明光强校正研究下载： 1066次

Intensity Correction Research for Fourier Ptychographic Microscopy

论文大纲

杨佳琪 ^1,*马骁 ¹林锦新 ¹钟金钢 ^1,2

作者单位

¹ 暨南大学光电工程系, 广东广州 510632

² 暨南大学广东省光纤传感与通信技术重点实验室, 广东广州 510632

成像系统显微术超分辨成像计算成像相位反演 imaging systems microscopy super-resolution imaging computational imaging phase retrieval

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摘要

傅里叶叠层显微术(FPM)是一种新型的计算显微成像技术，FPM与传统显微术照明方式不同，常采用可编程LED阵列进行不同角度照明，而LED灯珠发射光强与角度有关，随角度增大光强迅速减弱，不同角度照明光强不能保证一致，导致重建图像质量下降。因此,在进行相位迭代反演计算过程中，需要对不同角度照明拍摄的图像进行光强校正。介绍了不同角度照明光强不均一的原因，通过数值模拟，探讨了对不同角度照明光强进行校正的必要性，最后给出了物理上光强校正的实验结果。

Abstract

Fourier ptychographic microscopy (FPM) is a recently developed computational microscopy. Different from the conventional microscopy, the FPM generally employs a programmable LED array as an illumination source for angular illuminations. The intensity of LED illumination is corresponding to the emitting angle. The luminous intensity decreases rapidly with the increasing of emitting angle. The illumination intensity of different angles cannot be consistent, which leads to the decline of the reconstructed image quality. Consequently, the intensity correction of low-resolution raw images is consequently needed before the iterative phase retrieval process. The reasons of the different angles of illumination intensity inhomogeneity are introduced. Numerical simulations demonstrate the necessity of the intensity correction. Finally, the experimental results of physical intensity correction are given.

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杨佳琪, 马骁, 林锦新, 钟金钢. 傅里叶叠层显微术的照明光强校正研究[J]. 激光与光电子学进展, 2017, 54(3): 031101. Yang Jiaqi, Ma Xiao, Lin Jinxin, Zhong Jingang. Intensity Correction Research for Fourier Ptychographic Microscopy[J]. Laser & Optoelectronics Progress, 2017, 54(3): 031101.

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