应用光学, 2007, 28 (4): 0517, 网络出版: 2010-06-03
光学薄膜折射率和厚度测试仪检定规程解读
Explanation of verification procedure for tester of optical film refractive index and thickness
引用该论文
杨照金, 王雷, 黎高平, 许荣国. 光学薄膜折射率和厚度测试仪检定规程解读[J]. 应用光学, 2007, 28(4): 0517.
YANG Zhao-jin, WANG Lei, LI Gao-ping, XU Rong-guo. Explanation of verification procedure for tester of optical film refractive index and thickness[J]. Journal of Applied Optics, 2007, 28(4): 0517.
杨照金, 王雷, 黎高平, 许荣国. 光学薄膜折射率和厚度测试仪检定规程解读[J]. 应用光学, 2007, 28(4): 0517. YANG Zhao-jin, WANG Lei, LI Gao-ping, XU Rong-guo. Explanation of verification procedure for tester of optical film refractive index and thickness[J]. Journal of Applied Optics, 2007, 28(4): 0517.
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