基于性能退化数据的超辐射发光二极管可靠性评估研究 下载: 572次
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晁代宏, 马静, 张春熹. 基于性能退化数据的超辐射发光二极管可靠性评估研究[J]. 光学学报, 2010, 30(10): 3044. Chao Daihong, Ma Jing, Zhang Chunxi. Reliability Assessment of Superluminescent Diodes from Performance Degradation Data[J]. Acta Optica Sinica, 2010, 30(10): 3044.