光学学报, 1988, 8 (11): 1044, 网络出版: 2011-09-16
用横向光热偏转技术测量光学薄膜的微弱光吸收
Measurement of Weak Absorptions of Optical Coatings By Transverse Photothermal Deflection Technique
摘要
用横向光热偏转技术(TPDS)测量光学薄膜的弱吸收,灵敏度达10~(-5).因为薄膜样品在调制频率较低时属热薄试样,本文基于这一原理实现了TPDS的精密定标.
Abstract
Weak absorptions of optical coatings are measured by transverse photothermal deflection speotroscopy (TPDS) with a sensitivity of as high as 10~(-5). The experimental results are in good agreement with those measured by a laser calorimeter.
吴周令, 唐晋发, 施柏煊. 用横向光热偏转技术测量光学薄膜的微弱光吸收[J]. 光学学报, 1988, 8(11): 1044. Wu ZHOULING, TANG JINFA, SHI BAIXUAN. Measurement of Weak Absorptions of Optical Coatings By Transverse Photothermal Deflection Technique[J]. Acta Optica Sinica, 1988, 8(11): 1044.
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