半导体光子学与技术, 2003, 9 (4): 230, 网络出版: 2011-08-12  

Vibration Compensation for Scanning Tunneling Microscope

Vibration Compensation for Scanning Tunneling Microscope
作者单位
State Key Lab. of Precision Measurement Technology and Instrument, Tianjin University, Tianjin 300072, CHN
引用该论文

LI Meng-chao, FU Xing, WEI Xiao-lei, HU Xiao-tang. Vibration Compensation for Scanning Tunneling Microscope[J]. 半导体光子学与技术, 2003, 9(4): 230.

LI Meng-chao, FU Xing, WEI Xiao-lei, HU Xiao-tang. Vibration Compensation for Scanning Tunneling Microscope[J]. Semiconductor Photonics and Technology, 2003, 9(4): 230.

参考文献

[1] BAI Chun-li.Scanning Tunneling Micro-technology and Application[M]. Shanghai:Shanghai Science and Technology Press,1992(in Chinese).

[2] SHI Yuan.Vibration Measurement and Analysis[M].Shanghai:Tongji University Press,1990.21-22(in Chinese).

[3] Binning G,Rohrer H. Surface studies by scanning tunneling microscopy[J]. Phys.Rev.Lett.,1982, (49):57-61.

LI Meng-chao, FU Xing, WEI Xiao-lei, HU Xiao-tang. Vibration Compensation for Scanning Tunneling Microscope[J]. 半导体光子学与技术, 2003, 9(4): 230. LI Meng-chao, FU Xing, WEI Xiao-lei, HU Xiao-tang. Vibration Compensation for Scanning Tunneling Microscope[J]. Semiconductor Photonics and Technology, 2003, 9(4): 230.

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