Chinese Optics Letters, 2018, 16 (10): 102401, Published Online: Oct. 12, 2018
Optical rectification in surface layers of germanium Download: 787次
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Fig. 1. Ge samples and the measurement setup of EFI OR. (a) The Ge(001) samples; (b) the Ge(110) samples; (c) the Ge(111) samples; (d) the metal–semiconductor–metal configuration of Ge samples; (e) the measurement system for EFI OR.
Fig. 2. EFI OR signals versus the polarization azimuth of the probing beam in the (a) Ge(001), (b) Ge(110), and (c) Ge(111) surface layers.
Li Zhang, Fangye Li, Shuai Wang, Qi Wang, Kairan Luan, Xi Chen, Xiuhuan Liu, Lingying Qiu, Zhanguo Chen, Jihong Zhao, Lixin Hou, Yanjun Gao, Gang Jia. Optical rectification in surface layers of germanium[J]. Chinese Optics Letters, 2018, 16(10): 102401.